Enhance your research with our X-ray Diffraction and micro-CT suite. Our X-ray facility provides high-resolution imaging and precise analysis of material structures, offering the accuracy and detail needed for reliable results in your investigations.
Available Equipment
Zeiss Xradia 620 Versa X-ray Micro-CT
Capabilities:
- High-resolution 3D imaging of metals, ceramics, and biological materials
- Non-destructive analysis and flaw identification
- Structural and failure analysis
- High aspect ratio tomography
- W target and tube for high-intensity x-ray source with 0.5 μm resolution
- Minimum voxel dimensions of about 40 nm
- Specimen sizes between 5 mm and 100 mm, up to 25 kg
- In situ heating/cooling/tension/compression (DEBEN) stage
- Location: G4 Straumanis-James Hall
Check Availability | Reserve Equipment via FOM (trained users) | Faculty Authorization Form | Request Service
Panalytical X’Pert Pro Powder Diffractometer (MPD)
Capabilities:
- The Philips X-Pert Multipurpose Diffractometer is equipped with a PiXcel detector and 15 sample changers, allowing for rapid data collection with an excellent signal-to-noise ratio.
- It features both a Pt and W heating strip with maximum temperature capabilities of 1500 C and 2300 C respectively.
- The instrument is also equipped with a small angle X-ray scattering (SAXS) attachment.
- Location: G6 Straumanis-James Hall
Check Availability | Reserve Equipment via FOM(trained users) | Faculty Authorization Form | Request Service
Diffractometer – Philips Thin Film (MRD)
Capabilities:
- The Philips X-Pert Diffractometer is a specialized diffractometer best suited for thin film studies.
- A variety of switchable PREFIX optics modules are available that allow for grazing incidence diffraction of thin films, stress and texture analysis, as well as high-resolution studies of epitaxial films, including rocking curves and reciprocal space mapping.
- Location: G6 Straumanis-James Hall
Check Availability | Reserve Equipment via FOM (trained users) | Faculty Authorization Form | Request Service
NEXSA Surface Analysis System (XPS-Raman)
Capabilities:
- Surface chemistry and depth profiling
- Elemental and binding energy identification
- Structural identification by in-situ Raman spectrometer
- Monochromated, micro-focused, low-power Al Ka Xray source
- X-ray spot size selectable 10 – 400 μm
- Sputtering available with MAGCIS Dual Mode Ion Source
- 180° double-focusing, hemispherical analyzer with
- 128-channel detector
- Vacuum transfer module, adaptor for glove box integration
- Location: G4 Straumanis-James Hall
Check Availability | Reserve Equipment via FOM (trained users) | Faculty Authorization Form | Request Service
Oxford X-Supreme 8000 X-ray Fluorescence Spectrometer
Capabilities:
- Energy dispersive x-ray fluorescence to characterize elements Na (11) through U (92)
- Quantification from parts per million of heavier elements
- Multi-sample changer for repeatability for powders, granules, and irregular shapes
- He purge for better light element quantification
- Minimal specimen preparation time required
- Location: G4 Straumanis-James Hall
Check Availability | Reserve Equipment via FOM (trained users) | Faculty Authorization Form | Request Service
General Inquiries
If you have a question about our equipment capabilities or want to know more about what’s available, let us know!
Senior Research Specialists
Dr. Eric Bohannan
bohannan@mst.edu
XRD, TGA/DTA
Phone: (573) 341-4534
G-6 Straumanis-James Hall